Process characterization using DoE and parallel small-scale process:

  • • Efficient screening DoE (e.g., definitive screening, fractional factorial) to identify critical/key parameters affecting yield and quality
  • • Process mapping (e.g., response surface) to establish acceptable ranges for critical/key parameters
  • • New advanced DoE methodology that combines screening & mapping in one single design (>30% run reduction)
  • • Verification of DoE results